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Сканирующий туннельный микроскоп

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Сканирующий туннельный микроскоп
Сканирующий туннельный микроскоп Под заказ
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    • Адрес:
      ул. Борщаговская, 152А, оф.193, Киев, 03056, Украина
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Сканирующий туннельный микроскоп The Nanosurf Easyscan 2 is a modular scanning probe microscopy system that offers flexibility at a great price: one controller, several scan head types, and various upgrade possibilities! Meant to resolve atomic structures at the surface of electrically conductive materials, this easy-to-use and compact, scanning tunnelling microscope is particularly suitable for training purposes. The complete system includes a probe for row-by-row scanning of sample surfaces with the measuring tip, vibration-absorbing pad, controller with computer interface, as well as graphite and gold samples. Experiment topics: Tunnel effect Representation of individual atoms Representation of lattice defects and dislocations Representation of charge density waves Dependence of tunnel current on distance between measuring tip and sample PID control of tunnel current System requirements: Windows 2000 or higher XYZ grid: 500x500x200 nm Minimum increment XY: 7.6 pm Minimum increment Z: 3 pm Tunnel current: 0.100 …100.000 nA (0.025 nA increment) Voltage: ±10.000 V (0.005 V increment) Maximum sample size: 10 mm diam. Supply voltage: 90 – 240 V, 50/60 Hz Connection: USB Scope of Delivery: Controller Installation CD with measurement and control software Scanning probe with connection cable Cover with lens Experiment plate with vibration damping Tool kit for manufacturing the probe tip (side cutters, flat-nose pliers, pointed and rounded tweezers) Platinum-iridium wire, 0.25 mm diam., 300 mm Graphite (HOPG) sample on a carrier Gold (1.1.1) sample on a carrier Set of 4 sample carriers Подробности уточняйте у менеджеров компании
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